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J Electr Electron Mater : Journal of Electrical and Electronic Materials

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광원 및 응용기술 : LED용 실리콘 봉지재의 경화방법이 신뢰성에 미치는 영향

김완호, 장민석, 강영래, 김기현, 송상빈, 여인선, 김재필

Light Source and Application Technology : Effect of Curing Method on the Reliability of Silicone Encapsulant for Light Emitting Diode

Wan Ho Kim, Min Suk Jang, Young Rae Kang, Ki Hyun Kim, Sang Bin Song, In Seon Yeo, Jae Pil Kim
J Electr Electron Mater 2012;25(10):844-848.
Published online: October 1, 2012
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Encapsulant curing in terms of convection oven leads to thermal induced stress due to nonuniform thermal conductivity in LED package. We have adopted infrared (IR) light for silicone curing in order to release the stress. The light uniformity irradiated on an encapsulant surface is confirmed to be uniform by optical simulation. Shear strength of die paste using IR compared to convection oven is increased 19.2% at the same curing time, which indicates curing time can be shortened. The indentation depth difference between center and edge of silicone encapsulant in terms of convection oven and IR are 14.8% and 3.4%, respectively. Curing by IR also shows 2.3% better radiant flux persistency rate of LED at 85℃ after 1,000 h reliability test compared to convection curing.

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Light Source and Application Technology : Effect of Curing Method on the Reliability of Silicone Encapsulant for Light Emitting Diode
J Electr Electron Mater. 2012;25(10):844-848.   Published online October 1, 2012
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:
Include:
Light Source and Application Technology : Effect of Curing Method on the Reliability of Silicone Encapsulant for Light Emitting Diode
J Electr Electron Mater. 2012;25(10):844-848.   Published online October 1, 2012
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