Skip to main navigation Skip to main content
  • KIEEME

J Electr Electron Mater : Journal of Electrical and Electronic Materials

OPEN ACCESS
ABOUT
BROWSE ARTICLES
EDITORIAL POLICIES
FOR CONTRIBUTORS

Articles

박막,센서 : 플라즈모닉스 현상을 이용한 전반사 기반 다층 유전체 박막 센서의 특성 분석

김홍승, 이태경, 김두근, 정유라, 오금윤, 이병현, 기현철, 최영완

Thin Films and Sensors : Characteristics Analysis of Total Internal Reflection-based Dielectric Multi-Layer Sensor Using Plasmonics Phenomena

Hong Seung Kim, Tae Kyeong Lee, Doo Gun Kim, You Ra Jung, Geum Yoon Oh, Byeong Hyeon Lee, Hyun Chul Ki, Young Wan Choi
J Electr Electron Mater 2012;25(7):516-520.
Published online: July 1, 2012
  • 5 Views
  • 0 Download
  • 0 Crossref
  • 0 Scopus
prev next

In this paper, we have theoretically analyzed and designed a dielectric multi-layer sensor with a SPR (surface plasmon resonance) using analytical calculation and FDTD (finite difference time-domain) methods. The proposed structure is composed of periodic layer and thin metal film. It has many advantages. One of that is a high sensitivity of the SPR. Another is a high Q-factor of the characteristics in the PhC (photonic crystals) micro-cavity structure. The incident light has double resonance characteristics, because the filtered light by PhC structure, dielectric multi-layer, is met the thin metal film for SPR effect. We have also observed the change of resonance characteristics according to the variation of effective index on the metal film.

Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:

Include:

Thin Films and Sensors : Characteristics Analysis of Total Internal Reflection-based Dielectric Multi-Layer Sensor Using Plasmonics Phenomena
J Electr Electron Mater. 2012;25(7):516-520.   Published online July 1, 2012
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:
Include:
Thin Films and Sensors : Characteristics Analysis of Total Internal Reflection-based Dielectric Multi-Layer Sensor Using Plasmonics Phenomena
J Electr Electron Mater. 2012;25(7):516-520.   Published online July 1, 2012
Close