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Co60 - γ 선 조사에 따른 MOS 구조의 계면 및 산화막내에서의 특성변화

김봉흡, 류부형, 이상돈

The Variation of Characteristics Induced by Co60 - γ ray at the Interface and Oxide Layer of MOS Structure

Bong Heup Kim, Boo Hyung Ryu, Sang Don Lee
J Electr Electron Mater 1988;1(3):269-277.
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The Variation of Characteristics Induced by Co60 - γ ray at the Interface and Oxide Layer of MOS Structure
J Electr Electron Mater. 1988;1(3):269-277.
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Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

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The Variation of Characteristics Induced by Co60 - γ ray at the Interface and Oxide Layer of MOS Structure
J Electr Electron Mater. 1988;1(3):269-277.
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