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Defect Analysis via Photoluminescence of p-type ZnON Thin Film fabricated by RF Magnetron Sputtering

Hu Jie Jin, Soon Jin So, Choon Bae Park
J Electr Electron Mater 2007;20(3):202-206.
Published online: March 1, 2007
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Defect Analysis via Photoluminescence of p-type ZnON Thin Film fabricated by RF Magnetron Sputtering
J Electr Electron Mater. 2007;20(3):202-206.   Published online March 1, 2007
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:
Include:
Defect Analysis via Photoluminescence of p-type ZnON Thin Film fabricated by RF Magnetron Sputtering
J Electr Electron Mater. 2007;20(3):202-206.   Published online March 1, 2007
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