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J Electr Electron Mater : Journal of Electrical and Electronic Materials

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고효율 PDP를 위한 진공 인라인 실장에서의 MgO 보호막 영향분석

권상직, 장찬규

MgO Thin Film Characterization in a Vacuum In-Line Sealing Process for High-efficiency PDP

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J Electr Electron Mater 2005;18(11):1019-1023.
Published online: November 1, 2005
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MgO Thin Film Characterization in a Vacuum In-Line Sealing Process for High-efficiency PDP
J Electr Electron Mater. 2005;18(11):1019-1023.   Published online November 1, 2005
Download Citation

Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.

Format:
Include:
MgO Thin Film Characterization in a Vacuum In-Line Sealing Process for High-efficiency PDP
J Electr Electron Mater. 2005;18(11):1019-1023.   Published online November 1, 2005
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