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재산화 질화산화막의 기억트랩 분석과 프로그래밍 특성

남동우, 안호명, 한태현, 이상은, 서광열

A Study on the Memory Trap Analysis and Programming Characteristics of Reoxidized Nitrided Oxide

Dong Woo Nam, Ho Myoung An, Tae Hyeon Han, Sang Eun Lee, Kwang Yell Seo
J Electr Electron Mater 2002;15(7):576-582.
Published online: July 1, 2002
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A Study on the Memory Trap Analysis and Programming Characteristics of Reoxidized Nitrided Oxide
J Electr Electron Mater. 2002;15(7):576-582.   Published online July 1, 2002
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Download a citation file in RIS format that can be imported by all major citation management software, including EndNote, ProCite, RefWorks, and Reference Manager.
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A Study on the Memory Trap Analysis and Programming Characteristics of Reoxidized Nitrided Oxide
J Electr Electron Mater. 2002;15(7):576-582.   Published online July 1, 2002
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