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핫 캐리어 신뢰성 개선을 위한 새로운 LDD 구조에 대한 연구

서용진, 김상용, 이우선, 장의구

A Study on New LDD Structure for Improvements of Hot Carrier Reliability

Yong Jin Seo, Sang Yong Kim, Woo Sun Lee, Eui Goo Chang
J Electr Electron Mater 2002;15(1):1-6.
Published online: January 1, 2002
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A Study on New LDD Structure for Improvements of Hot Carrier Reliability
J Electr Electron Mater. 2002;15(1):1-6.   Published online January 1, 2002
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A Study on New LDD Structure for Improvements of Hot Carrier Reliability
J Electr Electron Mater. 2002;15(1):1-6.   Published online January 1, 2002
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