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"Ultra wide band electromagnetic radiation"

Vulnerability Analysis of Network Communication Device by Intentional Electromagnetic Interference Radiation
Chang-su Seo, Chang-su Huh, Sung-woo Lee, In-young Jin
J Electr Electron Mater 2018;31(1):44-49.   Published online January 1, 2018
This study analyzed the Vulnerability of Network Communication devices when IEMI is coupled with the Network System. An Ultra Wide Band Generator (180 kV, 700 MHz) was used as the IEMI source. The EUTs are the Switch Hub and Workstation, which are used to configure the network system. The network system was monitored through the LAN system configuration, to confirm a malfunction of the network device. The results of the experiment indicate that a malfunction of the network occurs as the electric field increases. The data loss rate increases proportionally with increasing radiating time. In the case of the Switch Hub, the threshold electric field value was 10 kV/m for all conditions used in this experiment. The threshold point causing malfunction was influenced only by the electric field value. The correlation between the threshold point and pulse repetition rate was not found. However, in case of the Workstation, it was found that as the pulse repetition rate increases, the equipment responds weakly and the threshold value decreases. To verify the electrical coupling of the EUT by IEMI, current sensors were used to measure the PCB line inside the EUT and network line coupling current. As a result of the measurement, it can be inferred that when the coupling current due to IEMI exceeds the threshold value, it flows through the internal equipment line, causing a malfunction and subsequent failure. The results of this study can be applied to basic data for equipment protection, and effect analysis of intentional electromagnetic interference.
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