In this study, the thermal degradation properties of polyethylene terephthalate film has been examined by the capacitance, Tan δ, thermography, FTIR, and SEM results at temperatures of 90~170℃ and frequencies of 0.3~3,000 kHz. It was found that the capacitance decreased with increasing thermal imaging temperature, probably caused by weakening of chemical bond with increasing temperature. Tan δ decreased upon increasing temperature from 90℃ to 170℃, probably due to the molecular motion of COOH radical or OH radical. The FT-IR measurement reveals that no structural change of the material occurs upon thermal radiation. The SEM measurement shows that the material is stabilized by thermal decomposition with increasing temperature; however, excessive thermal degradation obstructs the stabilization of the material.

In this thesis, the partial discharge according to applied voltage and variations of cross-sectional area and length of the conductor related to general condition for using cable was measured in order to study degradation diagnosis for 2-Core cable of the PVC insulator used in industrial fields for other safety installations. Also the thermal degradation conditions under various installation circumstances of cables were studied by assuming degradation conditions with each different degradation rate (50%, 67%, 100%) such as variation in degradated temperature, thermal exposure time, normal state, partially degradated state and overall degradated state for thermal degradation diagnosis. The quantity of electric discharge (V-Q) according to applied voltage was measured for measurement of inception voltage and extinction voltage. The quantity of electric discharge and the number of electric discharge (Q-N) were measured with applied voltage kept constantly. In addition, pictures were taken using SEM (scanning electron microscope) to compare the surface of external insulator to degradated state of internal insulator according to thermal degradation temperature and also compare the surface of external insulator to degradated surface state of internal insulator according exposure time of cables to thermal stress.