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"Temperatures"

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"Temperatures"

Effect of Microstructure on Piezoelectric Properties and TCC Behavior in PZT-PZN Ceramics
Intae Seo, Yongsu Choi, Yuri Cho, Hyung-won Kang, Kang San Kim, Chae Il Cheon, Seung Ho Han
J Electr Electron Mater 2022;35(5):445-451.   Published online September 1, 2022
DOI: https://doi.org/10.4313/JKEM.2022.35.5.4
Ultrasonic sensor is suitable as a next-generation autonomous driving assist device because its lower price compared to that of other sensors and its sensing stability in the external environment. Although Pb(Zr, Ti)O3 (PZT)-relaxor ferroelectric system has excellent piezoelectric properties, the change in capacitance is large in the daily operating temperature range due to the low phase transition temperature. Recently, many studies have been conducted to improve the temperature stability of ferroelectric ceramics by controlling the grain size and crystal structure, so it is necessary to study the effect of the grain size on the piezoelectric properties and the temperature stability of PZT-relaxor ferroelectric system. In this study, the piezoelectric properties, phase transition temperature, and temperature coefficient of capacitance (TCC) of 0.9 Pb(Zr1-xTix)O3-0.1 Pb(Zn1/3Nb2/3)O3 (PZTx-PZN) ceramics with various grain sizes were investigated. PZTx-PZN ceramics with larger grain size showed higher piezoelectric properties and temperature stability, and are expected to be suitable for ultrasonic devices in the future.
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Effect of Temperature on the Characteristics of ZnO Thin Film Applied to the Window Layer of CIGS Solar Cells
Eou Sik Cho, Kyung Seo Jung, Sang Jik Kwon
J Electr Electron Mater 2013;26(4):304-308.   Published online April 1, 2013
For the application to the window layer of Cu(In,Ga)Se2 (CIGS) solar cell, zinc oxide(ZnO) thin film was deposited at various temperatures by in-line pulsed DC sputtering. From the structural, optical, and electrical investigation and analysis, it was possible to obtain the lower thickness, the lower resistivity, and the higher transmittance at a higher process temperature. The energy band gap of ZnO was calculated using the transmittance data and was analyzed in terms of the dependency on temperature. From the X-ray diffraction(XRD) results, it was possible to conclude that a dominant peak was found about 34.2 ~ 34.6° (111) and crystallinity was obtained at a temperature above 150℃.
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The Microwave Dielectric Properties of Bi0.97Tm0.03NbO4 Doped with V2O5
Chang Gyu Hwang, Geon Ig Jang, Dae Ho Yun
J Electr Electron Mater 2003;16(11):975-978.   Published online November 1, 2003
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