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TSC
WHERE t1.sid in(parameter_dbtbl_keyword '%TSC%') and t1.xml_status <> 99
6
results for
"TSC"
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Keywords
Critical current (2)
HTSC thin film (2)
Double layer (1)
Electret (1)
Fault current (1)
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Publication year
2010 (1)
2006 (1)
2005 (3)
2003 (1)
Authors
Byeong Su Kim (1)
Deog Chul Lee (1)
Sung Hun Lim (1)
Keywords
Critical current (2)
HTSC thin film (2)
Double layer (1)
Electret (1)
Fault current (1)
Fault current Limiting (1)
Fault current Limiting characteristics (1)
Flux-Lock type SFCL (1)
Flux-Lock type superconducting fault current Limiter (1)
FT-IR (1)
High-Tc superconducting (HTSC) elements (1)
High-Tc superconducting (HTSC) power cable (1)
Initial Limiting current Level (1)
Magnetically coupled Shunt reactors (1)
Power burden (1)
Quench characteristics (1)
SFCL (1)
Shield Layer (1)
Superconducting fault current Limiter (1)
The flux-Lock type SFCL (1)
The independent operation of HTSC element (1)
Thermal stability (1)
Transport current distribution (1)
TSC (1)
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"TSC"
Analysis on Power Burden of HTSC Elements Comprising SFCL using Magnetic Coupling of Shunt Reactors
Sung Hun Lim
J Electr Electron Mater
2010;23(1):42-47.
Published online January 1, 2010
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Analysis on Current Distribution in Multi-Layer HTSC Power Cable with Shield Layer
J Electr Electron Mater
2006;19(3):273-279.
Published online March 1, 2006
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8
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Analysis of Fault Current Limiting Characteristics due to Ratio of Inductances between Coil 1 and coil 2 in a Flux-lock Type SFCL
J Electr Electron Mater
2005;18(9):856-862.
Published online September 1, 2005
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Analysis on Operational Current and Current Distribution between Two Coils of Flux-Lock Type SFCL
J Electr Electron Mater
2005;18(8):753-758.
Published online August 1, 2005
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Comparison of Operating Characteristics between Flux-Lock Type and Resistive Type Superconducting Fault Current Limiters
J Electr Electron Mater
2005;18(4):363-369.
Published online April 1, 2005
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Organic Insulation Materials : The Thermal Stability of Teflon AF/FEP Double Layer Film Electret
Byeong Su Kim, Deog Chul Lee
J Electr Electron Mater
2003;16(8):693-699.
Published online August 1, 2003
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