Skip to main navigation Skip to main content
  • KIEEME

J Electr Electron Mater : Journal of Electrical and Electronic Materials

OPEN ACCESS
ABOUT
BROWSE ARTICLES
EDITORIAL POLICIES
FOR CONTRIBUTORS

Page Path

1
results for

"Reliability assurance"

Keywords

Publication year

Authors

"Reliability assurance"

Revicw Paper A Review on the Failure Mechanism for Crystalline Silicon PV Module
Jeong Yeon Kim, Ju Hll Kim, Sung Ll Chan, Dong Gun Lim, Yang Seob Kim
J Electr Electron Mater 2014;27(6):343-349.   Published online June 1, 2014
It is summarized that potential causes of performance degradations and failure mechanisms ofcrystalline silicon photovoltaic (PV) modules installed in Middle East area. In addition, we also reviewedcurrent PV module qualification test (IEC 61215) and the methods for detection of wear-out fault. Thefailure of PV modules in the extreme environmental conditions such as deserts is mainly due to hightemperature, humidity, and dust storms. In particular, cementation phenomenon caused by combination ofsand and moisture leads to rapid degradation in the performance of PV modules. In order to evaluate andguarantee the long term reliability of PV modules, specific qualification tests such as sand dust test, saltmist test and potential induce degradation test considering operating environment of PV module should becarried out.
  • 7 View
  • 0 Download