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Fabrication of Multi-Fin-Gate GaN HEMTs Using Honeycomb Shaped Nano-Channel
Jeong Jin Kim, Jong Won Lim, Dong Min Kang, Sung Bum Bae, Ho Young Cha, Jeon Wook Yang, Hyeong Seok Lee
J Electr Electron Mater 2020;33(1):16-20.   Published online January 1, 2020
DOI: https://doi.org/10.4313/JKEM.2021.33.1.4
In this study, a patterning method using self-aligned nanostructures was introduced to fabricate GaN-based fin-gate HEMTs with normally-off operation, as opposed to high-cost, low-productivity e-beam lithography. The honeycomb-shaped fin-gate channel width is approximately 40~50 nm, which is manufactured with a fine width using a proposed method to obtain sufficient fringing field effect. As a result, the threshold voltage of the fabricated device is 0.6 V, and the maximum normalized drain current and transconductance of Gm are 136.4 mA/mm and 99.4 mS/mm, respectively. The fabricated devices exhibit a smaller sub-threshold swing and higher Gm peak compared to conventional planar devices, due to the fin structure of the honeycomb channel.
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A Statistical Analysis to the VLF Tanδ Criteria for Aging Diagnosis in Power Cables
Woosung Jung, Seongmin Kim, Jangseob Lim, Jin Lee
J Electr Electron Mater 2020;33(1):1-5.   Published online January 1, 2020
DOI: https://doi.org/10.4313/JKEM.2021.33.1.1
In this study, the
objective
is to improve the criteria used for statistical comparison of the VLF tanδ (TD) database and failure rate according to water-tree degradation in underground distribution power cables. The aging condition of the KEPCO criteria is divided into 6 levels using the Weibull distribution, and the “failure imminent” condition is quantified by using the statistical end-point of the lifetime parameter of the VLF big-data group obtained from KEPCO. Moreover, new criteria with a 2-dimensional combination of TD, DTD, and a statistical normalized factor are suggested. These criteria exhibit high reproducibility for the detection of cables in an imminent failure state. Consequently, it is expected that the adoption of the extended VLF-2019 criteria will reduce the asset management cost of cable replacement compared to the VLF-2012 criteria of KEPCO.
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Superconductor and Magnetic Materals Effect on the Transport Current and Quench Resistance of the HTS Wire with Normal-Superconducting Junction During the Fault Current Applying
Gonghyun Hong, Hoik Du, Byoungsung Han
J Electr Electron Mater 2015;28(10):625-629.   Published online October 1, 2015
The second-generation HTS wire its YBCO coated conductor is widely used in the superconducting power apparatus. The YBCO coated conductor uses the normal-superconducting junction to increase the transport capacity of superconducting power apparatus when it is applied. The normal-superconducting junction can be a cause of reducing the stability of the superconducting power apparatus when a fault current is applied. Thus, in this study we have conducted the effect analysing normal-superconducting junction for the fault current using transport current and quench resistance. From the experimental results when a fault current is applied, the effect on the normal-superconducting junction is reduced the larger the amplitude of the fault current and is helpful to maintain the thermal stability of the HTS wire.
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Analysis of Partial Discharge Pattern of Closed Switchgear using K-means Clustering
J Electr Electron Mater 2007;20(10):901-906.   Published online October 1, 2007
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Simulation of Electro-optical Properties of IPS-LCDs and VA-LCDs Considering FIow Effect
J Electr Electron Mater 2007;20(2):167-172.   Published online February 1, 2007
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Study of Ni-germano Silicide Thermal Stability for Nano-scale CMOS Technology
J Electr Electron Mater 2004;17(11):1149-1155.   Published online November 1, 2004
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Superconductor,Magnetic Materials : Suppression of the Abnormal Grain Growth in the Sintering of Yttrium Iron Garnet
Dong Yeong Kim, Hong Yeol Lee, Dong Seog Jeon, Sang Seog Lee
J Electr Electron Mater 2003;16(12):1131-1135.   Published online December 1, 2003
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