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Nitrogen concentration
WHERE t1.sid in(parameter_dbtbl_keyword '%Nitrogen concentration%') and t1.xml_status <> 99
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Ac stress (1)
Boron penetration (1)
Hot-carrier-Induced degradation (1)
Nitrided oxide (1)
Nitrogen concentration (1)
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2004 (1)
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Sung Keun Chang (1)
Youn Jang Kim (1)
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"Nitrogen concentration"
Characteristics of AC Hot-carrier-induced Degradation in nMOS with NO-based Gate Dielectrics
Sung Keun Chang, Youn Jang Kim
J Electr Electron Mater
2004;17(6):586-591.
Published online June 1, 2004
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