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J Electr Electron Mater : Journal of Electrical and Electronic Materials

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"Machine learning"

Prediction of Material’s Formation Energy Using Crystal Graph Convolutional Neural Network
Hyun-gi Lee, Dong-hwa Seo
J Electr Electron Mater 2022;35(2):134-142.   Published online March 1, 2022
DOI: https://doi.org/10.4313/JKEM.2022.35.2.4
As industry and technology go through advancement, it is hard to search new materials which satisfy various standards through conventional trial-and-error based research methods. Crystal Graph Convolutional Neural Network(CGCNN) is a neural network which uses material’s features as train data, and predicts the material properties(formation energy, bandgap, etc.) much faster than first-principles calculation. This report introduces how to train the CGCNN model which predicts the formation energy using open database. It is anticipated that with a simple programming skill, readers could construct a model using their data and purpose. Developing machine learning model for materials science is going to help researchers who should explore large chemical and structural space to discover materials efficiently.
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Defect Prediction Using Machine Learning Algorithm in Semiconductor Test Process
Suyeol Jang, Mansik Jo, Seulki Cho, Byungmoo Moon
J Electr Electron Mater 2018;31(7):450-454.   Published online November 1, 2018
Because of the rapidly changing environment and high uncertainties, the semiconductor industry is in need of appropriate forecasting technology. In particular, both the cost and time in the test process are increasing because the process becomes complicated and there are more factors to consider. In this paper, we propose a prediction model that predicts a final “good” or “bad” on the basis of preconditioning test data generated in the semiconductor test process. The proposed prediction model solves the classification and regression problems that are often dealt with in the semiconductor process and constructs a reliable prediction model. We also implemented a prediction model through various machine learning algorithms. We compared the performance of the prediction models constructed through each algorithm. Actual data of the semiconductor test process was used for accurate prediction model construction and effective test verification.
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