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"Line illumination system"

A Study on the Control Characteristics of Line Scan Light Source for Machine Vision Line Scan Camera
Tae-hwa Kim, Cheon Lee
J Electr Electron Mater 2021;34(5):371-381.   Published online September 1, 2021
DOI: https://doi.org/10.4313/JKEM.2021.34.5.15
A machine vision inspection system consists of a camera, optics, illumination, and image acquisition system. Especially a scanning system has to be made to measure a large inspection area. Therefore, a machine vision line scan camera needs a line scan light source. A line scan light source should have a high light intensity and a uniform intensity distribution. In this paper, an offset calibration and slope calibration methods are introduced to obtain a uniform light intensity profile. Offset calibration method is to remove the deviation of light intensity among channels through adding intensity difference. Slope calibration is to remove variation of light intensity slope according to the control step among channels through multiplying slope difference. We can obtain an improved light intensity profile through applying offset and slope calibration simultaneously. The proposed method can help to obtain clearer image with a high precision in a machine vision inspection system.
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