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"Inrush current"

Design for a Fuse of High Durability Protection Elements for Improving the Safety of DC Current Measurement Device
Ye Ji Lee, Jae Seo Youn, Sung Chul Cho, Sung Yeo Noh
J Electr Electron Mater 2020;33(3):201-207.   Published online May 1, 2020
DOI: https://doi.org/10.4313/JKEM.2021.33.3.8
With the expansion in the use of DC power systems and increased need for system maintenance, the development of measurement devices for maintenance requires high stability. Of the different kinds of DC current measurement devices, the single-shot measurement device causes the input signal of the current measuring unit to initially generate a high inrush current. The high inrush current flows into the signal processor of the meter, shortening the life of the internal fuses and causing failure. Therefore, in this study, the I2t value for increasing the durability of the fuse is designed using the available wire diameter. Operating characteristics for 210~400% over-current of the rated current, which is relatively low over-current, are realized by the plating of low melting tin metal. As a result, a method of designing a fuse element for a DC power supply, which improves the safety of the DC current measurement device by blocking the failure caused by the inrush current, is presented.
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