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"Indium-zinc oxide TFTs"

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"Indium-zinc oxide TFTs"

Characterization of Solution-Processed Oxide Transistor with Embedded Electron Transport Buffer Layer
Han-sang Kim, Sung-jin Kim
J Korean Inst Electr Electron Mater Eng 2017;30(8):491-495.   Published online August 1, 2017
DOI: https://doi.org/10.4313/JKEM.2017.30.8.491
We investigated solution-processed indium-zinc oxide (IZO) thin-film transistors (TFTs) by inserting a 2-(4- biphenylyl)-5-(4-tert-butylphenyl)-1,3,4-oxadiazole (PBD) buffer layer. This buffer layer efficiently tuned the energy level between the semiconducting oxide channel and metal electrode by increasing charge extraction, thereby enhancing the overall device performance: the IZO TFT with embedded PBD layer (thickness: 5 nm; width: 2,000 μm; length: 200 μm) exhibited a field-effect mobility of 1.31 cm2V-1s-1, threshold voltage of 0.12 V, subthreshold swing of 0.87 V decade-1, and on/off current ratio of 9.28×105.
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