Journal of Electrical and Electronic Materials

Thin Films and Sensors : Effects of Doping Concentration on the Properties of Ga-doped ZnO Thin Films Prepared by RF Magnetron Sputtering: Ki Cheol Park, Hyoung Min Kim, Dae Young Ma; J Korean Inst Electr Electron Mater Eng 2012;25(12):984-989. Published online December 1, 2012; DOI: https://doi.org/10.4313/JKEM.2012.25.12.984

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We have investigated the structural, electrical and optical properties of Ga-doped ZnO (GZO) thin films prepared by RF magnetron sputtering with laboratory-made ZnO targets containing 1, 3, 5, 7 wt% of Ga2O3 powder as a doping source. The GZO thin films show the typical crystallographic orientation with c-axis regardless of Ga2O3 content in the targets. The 3,000 Å thick GZO thin films with the lowest resistivity of 7×10-4 Ω·cm are obtained by using the GZO (Ga2O3= 5 wt%) target. Optical transmittance of all films shows higher than 80% at the visible region. The optical energy band gap for GZO films increases as the carrier concentration (ne) in the film increases.

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Realization of p-type Conduction in Antimony Doped ZnO Thin Films by PLD: Ki Ryeol Bae, Dong Wook Lee, J. Elanchezhiyan, Jae Won Lee, Yun Mi Bae, Byoung Chul Shin, Il Soo Kim, F. K. Shan; J Korean Inst Electr Electron Mater Eng 2009;22(10):814-820. Published online October 1, 2009; DOI: https://doi.org/10.4313/JKEM.2009.22.10.814

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The Effect of Thermal Annealing and Growth of CdGa2Se4 Single Crystal Thin Film by Hot Wall Epitaxy: Myung Seok Hong, Kwang Joon Hong; J Korean Inst Electr Electron Mater Eng 2007;20(10):829-838. Published online October 1, 2007; DOI: https://doi.org/10.4313/JKEM.2007.20.10.829

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Effect of Bias Voltage of Influenced on a Property of Electrical and Optical of ZnO:Al: J Korean Inst Electr Electron Mater Eng 2005;18(6):493-498. Published online June 1, 2005; DOI: https://doi.org/10.4313/JKEM.2005.18.6.493

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A Study of Oxygen Vacancy on SnO2 Thin Films: J Korean Inst Electr Electron Mater Eng 2005;18(2):109-115. Published online February 1, 2005; DOI: https://doi.org/10.4313/JKEM.2005.18.2.109

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Structural and X-Ray Photoelectron Spectroscopy Study of Al-Doped Zinc-Oxide Thin Films
Bong Ju Lee, Ho Jun Song, Jin Jeong
Advances in Materials Science and Engineering.2015; 2015: 1. CrossRef
Effect of the Change of Deposition Time on the Secondary Direction and Abnormal Shape of Grains Growth of SnO2Thin Films
Jin Jeong
Advances in Materials Science and Engineering.2015; 2015: 1. CrossRef