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"Half-bridge circuit"

Evaluation of Performance and Output Characteristics of Half-Bridge Bare Die 4H-SiC MOSFETs Under Variations of Switching Frequency and Duty Cycle
Yujin Seok, Hyoung Woo Kim, Ho-jun Lee, Chang-seung Ha
J Electr Electron Mater 2026;39(1):70-78.   Published online January 1, 2026
DOI: https://doi.org/10.4313/JEEM.2026.39.1.9
Silicon carbide (SiC) MOSFETs provide superior performance compared to traditional silicon devices under hightemperature and high-power conditions, making them particularly valuable for power electronics applications requiring highfrequency switching and high-energy efficiency. As the electric vehicle (EV) market expands, these devices are commonly packaged into six-pack modules, which can show their different electrical characteristics between the bare-die device and the package due to packaging that improves heat dissipation and other properties. This study uses bare-die SiC MOSFETs to explore their intrinsic characteristics and evaluate their performance in a half-bridge configuration. A half-bridge circuit was constructed, and performance was assessed by varying driving frequencies (10 kHz and 50 kHz) and adjusting the duty cycle between 20% and 80%. Analysis revealed that, at a fixed switching frequency, the average output voltage and average output current are proportional to the duty cycle.
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