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J Electr Electron Mater : Journal of Electrical and Electronic Materials

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"HTO"

A Study on Thermosonic Bonding Process and Its Reliability Evaluation of Joints
Young Eui Shin, Jin Suk Park, Sun Eik Son
J Electr Electron Mater 2009;22(8):625-631.   Published online August 1, 2009
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Properties of Poly-Si TFT`s using Oxide-Nitride-Oxide Films as Gate Insulators
In Chan Lee, Dae Yeong Ma
J Electr Electron Mater 2003;16(12):1065-1070.   Published online December 1, 2003
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