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"Ga-doped ZnO"

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"Ga-doped ZnO"

Properties of Sputtered Ga Doped ZnO Thin Film Under Various Reaction Gas Ratio
Jong Wook Kim, Hong Bae Kim
J Electr Electron Mater 2013;26(4):289-293.   Published online April 1, 2013
We have studied structural, optical, and electrical properties of the Ga-doped ZnO (GZO) thin films being usable in transparent conducting oxides. The GZO thin films were deposited on the corning 1737 glass plate by the RF magnetron sputtering system. To find optimal properties of GZO for transparent conducting oxides, the Ar gas in sputtering process was varied as 40, 60, 80 and 100 sccm, respectively. As reaction gas decreased, the crystallinity of GZO thin film was increased, the optical bandgap of GZO thin film increased. The transmittance of the film was over 80% in the visible light range regardless of the changes in reaction gas. The measurement of Hall effect characterizes the whole thin film as n-type, and the electrical property was improved with decreasing reaction gas. The structural, optical, and electrical properties of the GZO thin films were affected by Ga dopant content in GZO thin film.
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Thin Films and Sensors : Structural and Electrical Properties of Ga-doped ZnO-SnO2 Films
Ki Cheol Park, Tae Young Ma
J Electr Electron Mater 2011;24(8):641-646.   Published online August 1, 2011
Ga-doped ZnO-SnO2 (ZSGO) films were deposited by rf magnetron sputtering and their structural and electrical properties were investigated. In order to fabricate the target for sputtering, the mixture of ZnO, SnO2 (1:1 weight ratio) and Ga2O3 (3.0 wt%) powder was calcined at 800℃ for 1 h. The substrate temperature was varied from room temperature to 300℃. The crystallographic properties and the surface morphologies of the films were studied by X-ray diffraction (XRD) and Scanning Electron Microscopy (SEM). The optical transmittances of the films were measured and the optical energy band gaps were obtained from the absorption coefficients. The resistivity variation with substrate temperature was measured. Auger electron spectroscopy was employed to find the atomic ratio of Zn, Sn, Ga and O in the film deposited at room temperature. ZSGO films exhibited the optical transmittance in the visible region of more than 80% and resistivity higher than 10 Ωcm.
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Nano Materials and Devices : Sensing Characteristics of ZnO-based Ethanol Gas Sensor on Ga-doped Nanowires by Hot Walled Pulsed Laser Deposition
Da Woon Jung, Kyoung Won Kim, Deuk Hee Lee, Pulak Chandra Debnath, Sang Sig Kim, Sang Yeol Lee
J Electr Electron Mater 2011;24(7):594-598.   Published online July 1, 2011
We have investigated the sensing properties of ethanol gas sensor with pure ZnO and Ga-doped ZnO nanowires on Au coated (0001) sapphire substrates grown by hot walled pulsed laser deposition. Randomly aligned ZnO nanowires arrays were grown on a Au-electrode patterned under ambient conditions. ZnO nanowires have various sizes and shapes with a different substrate position inside a furnace. The average of length and diameter of the ZnO nanowires were 8 ㎛ and 100 ㎚ respectively, and confirmed by field emission scanning electron microscopy. Sensitivity chanege characterization of the gas sensor was found that measured sensitivities of the ethanol gas sensors were 83.3% and 68.3% at 300℃ respectively.
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Regular Paper : A Study on the Optical and Electrical Properties of Ga-doped ZnO Films for Opto-electronic Devices
Byung Woo Gil, Seong Eui Lee, Hee Chul Lee
J Electr Electron Mater 2011;24(4):303-308.   Published online April 1, 2011
The Gallium-doped ZnO(GZO) film deposited at a temperature of 200℃ and a pressure of 10 mtorr has an optical transmittance of 89.0% and a resistivity of 2.0 mΩ·cm because of its high crystallinity. Effect of Al2O3 oxide buffer layers on the optical and electrical properties of sputtered ZnO films were intensively investigated for developing the electrodes of opto-electronic devices which demanded high optical transmittance and low resistivity. The use of Al2O3 buffer layer could increase optical transmittance of GZO film to 90.7% at a wavelength of 550 nm by controlling optical spectrum. Resistivity of deposited GZO films were much dependent on the deposition condition of O2/(Ar+O2) flow rate ratio during the buffer layer deposition. It is considered that the Al2O3 buffer layer could increase the carrier concentration of the GZO films by doping effect of diffused Al atoms through the rough interface.
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The Characteristics of Ga-doped ZnO Transparent Thin Rims by using Multilayer
J Electr Electron Mater 2007;20(12):1044-1048.   Published online December 1, 2007
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Effect of Annealing on the Structural, Electrical and Optical Characteristics of Ga-doped ZnO(GZO)films
J Electr Electron Mater 2007;20(9):776-779.   Published online September 1, 2007
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