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"Flat lamp"

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"Flat lamp"

High Voltage and Discharge Engineering : Numerical Analysis of the Discharge and Luminous Characteristics of a Planar Type Xe Plasma Flat Lamp
Hyuk Hwan Kim, Won Jong Lee
J Korean Inst Electr Electron Mater Eng 2011;24(10):822-833.   Published online October 1, 2011
DOI: https://doi.org/10.4313/JKEM.2011.24.10.822
A Xe plasma flat lamp, which has been noticed as a new eco-friendly LCD (liquid crystal display) backlight, requires the improvement of the luminance and the luminous efficiency although it has several advantages. To improve the performance of a lamp, it is necessary to understand the effects of discharge variables on the luminous characteristics of the lamp. Since it is difficult to diagnose a lamp discharge experimentally, the numerical analysis can be used instead. In this study, the luminous characteristics of a planar type Xe plasma flat lamp were analyzed with the variation of an input voltage and a pulse frequency. The numerical analysis of a lamp discharge was then performed using a RCT (relaxation continuum) model and a LFA (local field approximation) model. The comparison with the experimental results showed that the RCT model is valid for the numerical analysis of the flat lamp. The numerical analysis also showed that the modifications of a high frequency component and a voltage falling rate in the input voltage waveform could improve the luminous characteristics of the lamp.
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Field Emission Properties of Flat Lamp using Carbon Nanotubes Grownon Glass Substrate
Yang Doo Lee, Seung Il Moon, Jong Hun Han, Yun Hi Lee, Byeong Kwon Ju
J Korean Inst Electr Electron Mater Eng 2004;17(6):647-651.   Published online June 1, 2004
DOI: https://doi.org/10.4313/JKEM.2004.17.6.647
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Display,Optical Devices : Structure and Electron Emission Properties of CN Nanostructures Obtained by HIP Apparatus
Jeong Geun O, Yang Du Lee, Seung Il Mun, Seog Hyeon Yang, Yun Hui Lee, Nam Su Kim, Byeong Gwon Ju
J Korean Inst Electr Electron Mater Eng 2003;16(8):723-730.   Published online August 1, 2003
DOI: https://doi.org/10.4313/JKEM.2003.16.8.723
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