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"FFT"

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"FFT"

Verification of Algorithm for Arc Detection Using High Pass Filter and FFT
Min-ho Yoon, You-jung Cho, Kyoung-tak Kim, Sung-hun Lim
J Electr Electron Mater 2023;36(5):520-524.   Published online September 1, 2023
DOI: https://doi.org/10.4313/JKEM.2023.36.5.13
An algorithm was developed to detect and block serial arc currents using HPF. The AC series arc problem is that the load current is greater than the fault current and no leakage current occurs. As a solution, an arc detection method utilizing differences in high- frequency amplitudes was developed. HPT was applied to the load current and FFT was applied to eliminate low frequencies. An algorithm has been developed to detect arc waveforms when they exceed a certain value compared to the average of normal waveforms. Using one cycle of data, arc detection is faster and arc accidents are prevented.
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Frequency Analysis and Reduction of Electronic Noise in ESS
Bong Man Ahn, Byoung Sung Han, Un Ki Han, Young Kwan Lee, Hyun Jin An
J Electr Electron Mater 2022;35(6):568-575.   Published online November 1, 2022
DOI: https://doi.org/10.4313/JKEM.2022.35.6.5
This paper is a study on frequency analysis and electronic noise reduction of energy storage system (ESS). We acquired 4 necessary data for about 2 minutes and 4 seconds using a sampling frequency of 10,000 Hz in ESS. Fast Fourier transform (FFT) was used for electronic noise analysis from the acquired data. As a result, it was confirmed that DC component, fundamental wave, second and higher harmonic component exist. For the attenuation of harmonics, low-pass filter (LPF) was applied. We confirmed that an attenuation of approximately 59.3% appears from the second harmonic. The presence of many harmonic components in the data of the ESS was expected to occur due to the insufficiency of optimization among the modules inside the ESS. Therefore, we propose that a national certification system for ESS should be introduced to settle down the issue properly.
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Anodization Process of the YBa2Cu3O7-x Strip Lines by the Conductive Atomic Force Microscope Tip
J Electr Electron Mater 2004;17(8):875-881.   Published online August 1, 2004
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Analysis of the Critical Characteristics in the Superconducting Strip Lines by ICP Etching System
Seok Cheol Ko, Hyeong Gon Kang, Hyo Sang Choi, Sung Chae Yang, Byoung Sung Han
J Electr Electron Mater 2004;17(7):782-787.   Published online July 1, 2004
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