In this paper, we fabricated Cu/Mn alloy shunt resistor with low resistance and thermal stability for use of mobile electronic devices. We designed metal alloy composed of copper (Cu) and manganese (Mn) to embody in low resistance and low TCR which are conflict each other. Cu allows high electrical conductivity and Mn serves thermal stability in this Cu/Mn alloy system. We confirmed the elemental composition of the designed metal alloy system by using energy dispersive X-ray (EDX) analysis. We obtained low resistance below 10 mΩ and low temperature coefficient of resistance (TCR) below 100 ppm/℃ from the designed Cu/Mn alloy resistor. And in order to minimize resistance change caused by alternative frequency on circuit, shape design of the metal alloy wire is performed by rolling process. Finally, we conclude that design of the metal alloy system was successfully done by alloying Cu and 3 wt% of Mn, and the Cu/Mn alloy resistor has low resistance and thermal stability.

Citations

• The Effect of Yttrium Addition on the Microstructures and Electrical Properties of CuMn Alloy Thin Films
  Ho-Yun Lee, Chi-Wei He, Ying-Chieh Lee
  Advances in Materials Science and Engineering.2019; 2019: 1.     CrossRef