In this paper, we prepared Cu(In,Ga)Se2 thin films by using co-evaporation method, and analyzed the properties of the thin films. During the thin film preparation process, we confirmed InGaSe2 phase was formed at 400℃ in first stage, and also confirmed the thin films showed the vacancy decrease. In second and third stage,we confirmed the density increase of crystalline structure at over 480℃ and the formation of Cu(In0.7Ga0.3)Se2phase. As the result of SEM and XRD analysis of the films which were before and after heat-treated, we confirmed the disappearance of Cu2Se2 and the formation of Cu(In0.7Ga0.3)Se2 single phase after the heat-treatment,We, therefore, confirmed the heat-treatment did not affect the absorbency spectra of the thin films.

Cu(In1-x,Gax)Se2 thin films have been considered as an effective absorber material for high efficient solar cells. In this paper, the CIGS thin films with varied Ga content were prepared using a co-evaporation process of three stage. We carry out structure and electrical optical property on the thin film in varied Ga content. CIGS thin films have been characterized by X-ray diffraction(XRD), scanning electron microscopy(SEM), energy-dispersive spectroscopy(EDS), four-point probe measurement, and the Hall measurement. To optimize Ga contents, Ga/(In+Ga) ratio were changed from 0.13 to 0.72. At this time the carrier concentrations were varied from 1.22×10(11) cm-3 to 5.07×10(16) cm-3, and electrical resistivity were varied from 1.11×10(0) Ω-cm to 1.08×10(2) Ω-cm. A strong <220/204> orientation and a lager grain size were obtained at a Ga/(In+Ga) of 0.3. We were able to achieve conversion efficiency as high as 15.95% with a Ga/(In+Ga) of 0.3.

In this paper, CuInSe2 thin film was prepared by use of the co-evaporation method with the variation of the substrate temperature in the range of 100℃ to 400℃. The film was annealed at 300℃ for an hour in a vacuum chamber at 3×10-4 Pa. After annealing, the thin film prepared at the substrate temperatures of 100℃ and 200℃ was observed. The XRD (x-ray diffraction) pattern of sample prepared at 100℃ showed the single phase formation of CuInSe2. However, at 200℃, there was no apparent difference in the XRD pattern except a variation in the intensity of the peak. As the annealing treatment of substrate improved the crystal structure of the film, it affected to the increase of an electron mobility, resulted in an increase in conductivity and a decrease in resistance. As a results, when the substrate temperature was at 200℃ and 300℃, the sheet resistance was 1.534 n/and 1.554 n/, respectively, and the resistivity was 1.76×10-6 n·㎝ and 1.7210-6 n·㎝, respectively. From the absorption spectrum measurements, there was no variation between the before and after annealing conductions. And it means that the annealing step does not affect the thickness of the thin film.