Because of the rapidly changing environment and high uncertainties, the semiconductor industry is in need of appropriate forecasting technology. In particular, both the cost and time in the test process are increasing because the process becomes complicated and there are more factors to consider. In this paper, we propose a prediction model that predicts a final “good” or “bad” on the basis of preconditioning test data generated in the semiconductor test process. The proposed prediction model solves the classification and regression problems that are often dealt with in the semiconductor process and constructs a reliable prediction model. We also implemented a prediction model through various machine learning algorithms. We compared the performance of the prediction models constructed through each algorithm. Actual data of the semiconductor test process was used for accurate prediction model construction and effective test verification.
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A real time monitoring system from a PC has been developed which can be accessed through transmitted data, which incorporates an established low powered transport system equipped with a single chip combined with wireless sensor network technology from a three-axis acceleration sensor. In order to distinguish between static posture and dynamic posture, the extracted parameter from the rapidly transmitted data needs differentiation of movement and activity structures and status for an accurate measurement. When results interpret a static formation, statistics referring to each respective formation, known as the K-mean algorithm is utilized to carry out a determination of detailed positioning, and when results alter towards dynamic activity, fuzzy algorithm (fuzzy categorizer), which is the relationship between speed and ISVM, is used to categorize activity levels into 4 stages. Also, the ISVM is calculated with the instrumented acceleration speed on the running machine according to various speeds and its relationship with kinetic energy goes through correlation analysis. With the evaluation of the proposed system, the accuracy level stands at 100% at a static formation and also a 96.79% accuracy with kinetic energy and we can easily determine the energy consumption through the relationship between ISVM and kinetic energy.
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