Skip to main navigation
Skip to main content
KIEEME
mobile search button
mobile menu button
Search
Advanced Search
ABOUT
ABOUT
Journal introduction
Aims and scope
Editorial board
Management team
Best practice
Subscription information
Contact us
BROWSE ARTICLES
All issues
Current issue
Most viewed
Most downloaded
Most cited
Search
Metrics
EDITORIAL POLICIES
Research ethics
Peer review policy
Copyright and open access policy
Article sharing policy
Archiving policy
Data sharing policy
Preprint policy
Crossmark policy
Advertising and sponsorship policy
Research misconduct-related regulations
FOR CONTRIBUTORS
Instructions for authors
Checklist
Copyright transfer agreement
Graphical abstract
E-SUBMISSION
ABOUT
Journal introduction
Aims and scope
Editorial board
Management team
Best practice
Subscription information
Contact us
BROWSE ARTICLES
All issues
Current issue
Most viewed
Most downloaded
Most cited
Search
Metrics
EDITORIAL POLICIES
Research ethics
Peer review policy
Copyright and open access policy
Article sharing policy
Archiving policy
Data sharing policy
Preprint policy
Crossmark policy
Advertising and sponsorship policy
Research misconduct-related regulations
FOR CONTRIBUTORS
Instructions for authors
Checklist
Copyright transfer agreement
Graphical abstract
Page Path
HOME
Search
Brush contamination
WHERE t1.sid in(parameter_dbtbl_keyword '%Brush contamination%') and t1.xml_status <> 99
1
results for
"Brush contamination"
Filter
Keywords
brush (1)
Brush contamination (1)
Post-CMP cleaning (1)
PVA (1)
Zeta potential (1)
Publication year
2009 (1)
Authors
Han Chul Cho (1)
Hae Do Jeong (1)
Suk Joo Kim (1)
Min Jong Yuh (1)
Keywords
brush (1)
Brush contamination (1)
Post-CMP cleaning (1)
PVA (1)
Zeta potential (1)
Cancel
Close
authors
Han Chul Cho (1)
Hae Do Jeong (1)
Suk Joo Kim (1)
Min Jong Yuh (1)
Cancel
Close
Publication Year
2009 (1)
Cancel
Close
Funded articles
Cancel
Close
"Brush contamination"
Effect of PVA Brush Contamination on Post-CMP Cleaning Performance
Han Chul Cho, Min Jong Yuh, Suk Joo Kim, Hae Do Jeong
J Electr Electron Mater
2009;22(2):114-118.
Published online February 1, 2009
PDF
9
View
0
Download
First
Prev
Page
of 1
Next
Last
×
TOP
First
Prev
