The rapid proliferation of artificial intelligence (AI) servers and high-performance computing systems has significantly elevated the technical and reliability requirements for multilayer ceramic capacitors (MLCCs). In such systems, MLCCs are critical passive components that must deliver high capacitance, fast transient response, and robust insulation performance under high temperature, voltage, and current density. This review examines the material, structural, and process innovations that underpin MLCC performance in AI applications. Key topics include the development of ultrathin dielectric layers (<0.5 μm), rare-earth doped BaTiO₃-based dielectrics with enhanced DC bias stability, and core-shell microstructures designed for temperature and field resilience. The paper also explores insulation degradation mechanisms―such as vacancydriven conduction and demixing―and advanced reliability assessment methodologies, including HALT, TSDC, and the tipping point framework. Comparisons with automotive-grade MLCCs highlight the unique requirements of AI systems, such as ultraminiaturization, high volumetric efficiency, and ppm-level field failure rates. Finally, the review discusses emerging trends in MLCC technology, including particle engineering, interface stabilization, and advanced lamination techniques, and provides insight into the future direction of capacitor development tailored to AI data center environments.

Citations

• Reliability enhancement in Dy-doped BaTiO3 nanoceramics: from core–shell structure to phase-field modeling
  Shuyan Huang, Xinjie Wang, Mengjian Xiao, Xu Cheng, Xiaohui Wang
  Journal of Materials Science.2026; 61(37): 27665.     CrossRef
• Key factors determining high-temperature operating lifetime of multilayer ceramic capacitors (MLCCs)
  Yuto Tomura, Tzu-han Weng, Yusuke Oba, Tomohiro Kajita, Daiki Ishii
  Japanese Journal of Applied Physics.2026; 65(16): 16SP05.     CrossRef
• Effect of BaZrO3 Addition on the Frequency and Temperature Dependent Dielectric Properties of BaTiO3-Based Ceramics
  Won-Su Lee, Jong Kyu Lee, Moon-Taek Cho, Jung Rag Yoon
  Journal of Electrical and Electronic Materials.2026; 39(5): 478.     CrossRef
• Manufacturing Process Optimization of Oxide-Based Multilayer Ceramic Batteries Using Multilayer Ceramic Processing Technologies
  Won-Su Lee, Jong Kyu Lee, Jung Rag Yoon
  Journal of Electrical and Electronic Materials.2026; 39(5): 519.     CrossRef

Next-generation wide-bandgap semiconductors such as SiC, GaN, and Ga₂O₃ are being considered as potential replacements for current silicon-based power devices due to their high mobility, larger size, and production of high-quality wafers at a moderate cost. In this study, we investigate the gradual modulation of chemical composition in multi-stacked metal oxide semiconductor thin films to enhance the performance and bias stability of thin-film transistors (TFTs). It demonstrates that adjusting the Ga ratio in the indium gallium oxide (IGO) semiconductor allows for precise control over the threshold voltage and enhances device stability. Moreover, employing multiple deposition techniques addresses the inherent limitations of solution-processed amorphous oxide semiconductor TFTs by mitigating porosity induced by solvent evaporation. It is anticipated that solution-processed indium gallium oxide (IGO) semiconductors, with a Ga ratio exceeding 50%, can be utilized in the production of oxide semiconductors with wide band gaps. These materials hold promise for power electronic applications necessitating high voltage and current capabilities.