Skip to main navigation
Skip to main content
KIEEME
mobile search button
mobile menu button
Search
Advanced Search
ABOUT
ABOUT
Journal introduction
Aims and scope
Editorial board
Management team
Best practice
Subscription information
Contact us
BROWSE ARTICLES
All issues
Current issue
Most viewed
Most downloaded
Most cited
Search
Metrics
EDITORIAL POLICIES
Research ethics
Peer review policy
Copyright and open access policy
Article sharing policy
Archiving policy
Data sharing policy
Preprint policy
Crossmark policy
Advertising and sponsorship policy
Research misconduct-related regulations
FOR CONTRIBUTORS
Instructions for authors
Checklist
Copyright transfer agreement
Graphical abstract
E-SUBMISSION
ABOUT
Journal introduction
Aims and scope
Editorial board
Management team
Best practice
Subscription information
Contact us
BROWSE ARTICLES
All issues
Current issue
Most viewed
Most downloaded
Most cited
Search
Metrics
EDITORIAL POLICIES
Research ethics
Peer review policy
Copyright and open access policy
Article sharing policy
Archiving policy
Data sharing policy
Preprint policy
Crossmark policy
Advertising and sponsorship policy
Research misconduct-related regulations
FOR CONTRIBUTORS
Instructions for authors
Checklist
Copyright transfer agreement
Graphical abstract
Page Path
HOME
Search
Bending test
WHERE t1.sid in(parameter_dbtbl_keyword '%Bending test%') and t1.xml_status <> 99
2
results for
"Bending test"
Filter
Keywords
Bending test (2)
AC breakdown (1)
Binder (1)
Conductive adhesive (1)
EDLC (1)
More +
Publication year
2008 (1)
2004 (1)
Authors
Jeon Wook Cho (1)
Jin Wook Choi (1)
Jae Hyeong Choi (1)
Hae Jong Kim (1)
Sang Hyun Kim (1)
More +
Keywords
Bending test (2)
AC breakdown (1)
Binder (1)
Conductive adhesive (1)
EDLC (1)
HTS cable (1)
Insulation (1)
Lighting impulse breakdown (1)
Resistivity (1)
Specific capacitance (1)
Cancel
Close
authors
Jeon Wook Cho (1)
Jin Wook Choi (1)
Jae Hyeong Choi (1)
Hae Jong Kim (1)
Sang Hyun Kim (1)
Eung Choon Lim (1)
Cancel
Close
Publication Year
2008 (1)
2004 (1)
Cancel
Close
Funded articles
Cancel
Close
"Bending test"
Design of Insulation and Bending Test for a 154 kV Class HTS Cable
Jin Wook Choi, Jae Hyeong Choi, Eung Choon Lim, Hae Jong Kim, Jeon Wook Cho, Sang Hyun Kim
J Electr Electron Mater
2008;21(11):1024-1028.
Published online November 1, 2008
PDF
7
View
0
Download
Electric and Mechanical Properties of CMC+PTFE Binary Binder Electrode for Electric Double Layer Capacitor
J Electr Electron Mater
2004;17(10):1079-1084.
Published online October 1, 2004
PDF
9
View
0
Download
First
Prev
Page
of 1
Next
Last
×
TOP
First
Prev
