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"BCTZSO3"

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"BCTZSO3"

Microstructure and Dielectric Properties of Low Temperature Sintering (Ba0.86Ca0.14)(Ti0.85Zr0.12Sn0.03)O3 System Ceramics
Ju-hyun Yoo
J Korean Inst Electr Electron Mater Eng 2016;29(7):404-407.   Published online July 1, 2016
DOI: https://doi.org/10.4313/JKEM.2016.29.7.404
In this study, to develop low temperature sintering capacitor composition ceramics with the good dielectric properties, (Ba0.86Ca0.14)(Ti0.85Zr0.12Sn0.03)O3 (BCTZ) ceramics were prepared by the conventional solid-state reaction method. The effects of B2O3 addition on the dielectric properties and microstructure was investigated. The XRD patterns demonstrated that all the specimens showed Perovskite phase, and secondary phases are indicated in the measurement range of XRD. And also, temperature coefficient of capacitance(TCC) of all the specimen sintered at 1,180℃ showed +3∼-56% except for x=0.006. For all the specimens, observed one peak was tetragonal cubic difuse phase transition temperature(Tc), which is located in the vicinity of room temperature.
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Microstructure and Dielectric Properties of (Ba0.86Ca0.14)(Ti0.85Zr0.12Sn0.03)O3 Ceramics
Sang Hoon Shin, Ju Hyun Yoo, Gwang Min Lee, Dong Chan Shin
J Korean Inst Electr Electron Mater Eng 2015;28(7):424-427.   Published online July 1, 2015
DOI: https://doi.org/10.4313/JKEM.2015.28.7.424
In this study, in order to develop the capacitor composition ceramics with the good dielectric properties, (Ba0.86Ca0.14)(Ti0.85Zr0.12Sn0.03)O3+ xCuO (x= 0.006~0.010) ceramics were prepared by the conventional solid-state reaction method. The effects of CuO addition on the microstructure and dielectric properties was investigated. All specimens indicated rhombohedra1 phase without any secondary phase. As CuO addition increased, the variation width of TCC was increased at more than 40°C. Also, the specimen with x=0.007 sintered at 1,250°C showed the high dielectric constant of 9,632 in spite of low temperature sintering temperature.
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Regular Paper : Microstructure and Dielectric Properties of (Ba1-xCax)(Ti0.85Zr0.12Sn0.03)O3 Ceramics
Sang Hoon Shin, Ju Hyun Yoo, Dong Chan Shin
J Korean Inst Electr Electron Mater Eng 2014;27(12):797-802.   Published online December 1, 2014
DOI: https://doi.org/10.4313/JKEM.2014.27.12.797
In this study, in order to develop the capacitor composition ceramics with the good dielectric properties, (Ba1-xCax)(Ti0.85Zr0.12Sn0.03)O3 (abbreviated as BCTZ) ceramics were prepared by the conventional solid-state reaction method. The effects of Ca substitution on the microstructure and dielectric properties was investigated. The X-ray diffraction patterns demonstrated that all the specimens showed perovskitephase, and secondary phases are indicated in the measurement range of X-ray diffraction. Also, all the specimens indicated an rhombohedron phase structure. It was identified from the X-ray diffraction patterns that the secondary phase formed in grain boundaries and then decreased the dielectric properties. For all the specimens, observed one peak was tetragonal cubic phase transition temperature(TC),which is located in the vicinity of room temperature.
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