As energy depletion and environmental pollution problems are intensified, research has been conducted actively on alternative energy sources, an eco-friendly and continuous available energy conversion system. So has been organic solar cells whose efficiency is improved to 18.32%. The photoactive layer inside the solar cell is composed of a donor and a acceptor, and the combination of materials capable of effectively exchanging electrons greatly affects the efficiency of the organic solar cell. Accordingly, various researches have been conducted to improve the efficiency, and the maximum efficiency could be achieved by a solar cell with high carrier generation and low charge recombination characteristics through the introduction of a non-fullerene acceptor and material reconstruction. Organic solar cells are still difficult to commercialize due to their efficiency limitations and light stability, but if a photoactive layer consisting of a donor capable of efficiently absorbing long-wavelength light and an acceptor capable of forming an appropriate energy level is designed, the efficiency of the organic solar cell will reach 20%.

Citations

• Solvent-Dependent Crystallization and Charge Transport Evolution in Thermally Annealed P3HT:PCBM Bulk Heterojunction Solar Cells
  Dong-Kyun Kim, Byungyou Hong, Hyung Jin Kim
  Journal of Electrical and Electronic Materials.2026; 39(4): 400.     CrossRef

We report on variations of electrical properties with different active layer thickness and post-annealing temperature in amorphous In-Ga-Zn-O (IGZO) thin-film transistors (TFTs). In particular, subthreshold swing (SS) of the IGZO-TFTs was improved as increasing the active layer thickness at an given post-annealing temperature, accompanying the negative shift in turn-off voltage. However, as increasing post-annealing temperature, only turn-off voltage was shifted negatively with almost constant SS value. The effect of the active layer thickness and post-annealing temperature on electrical properties, such as SS, field effect mobility and turn-off voltage in IGZO-TFTs has been explained in terms of the variation of trap density in IGZO channel layer and at gate dielectric/IGZO interface.