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Abrasive (1)
Accelerated aging (1)
Accelerating Aging Test (1)
Adhesion force (1)
Advanced vertical alignment-π cell (1)
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Authors
Ju Yeon Kim (2)
Yeong Sig Kim (2)
Byeong Gug An (1)
Un Sig Choe (1)
Jong Seon Choe (1)
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Keywords
Abrasive (1)
Accelerated aging (1)
Accelerating Aging Test (1)
Adhesion force (1)
Advanced vertical alignment-π cell (1)
Al2O3 substrate (1)
Anodizing (1)
Buffer layer (1)
Cathode separator (1)
Ceramic thin-film pressure sensor (1)
CHE injection (1)
chemical mechanical polishing (1)
CMP (1)
Conductivity (1)
Consumables (1)
Cool-heat test (1)
Current-voltage characteristics (1)
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Electro-optical characteristics (1)
EO (1)
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Heterostructure CMOS (1)
Homeotropic blended polyimide (1)
Hot Hole injection (1)
HRB test (1)
Insulation diagnosis (1)
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Mechanical polishing (1)
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authors
Ju Yeon Kim (2)
Yeong Sig Kim (2)
Byeong Gug An (1)
Un Sig Choe (1)
Jong Seon Choe (1)
Ji Won Choe (1)
Yeong Cheol Choe (1)
In Hyeog Choe (1)
I Mi Do (1)
Jeong In Han (1)
Se Won Han (1)
Jin Ung Hong (1)
Jeong Yeon Hwang (1)
Jeong Myeong Im (1)
Dong Ug Jang (1)
Un Jo Jeong (1)
Gwi Sang Jeong (1)
Gyeong Han Jeong (1)
Dong Hoe Jeong (1)
Yong Min Jo (1)
Han Gu Jo (1)
Byeong Gwon Ju (1)
Jin Yeong Kang (1)
Jong Yun Kang (1)
Yeong Jun Kim (1)
Sang Yong Kim (1)
Sang Hun Kim (1)
Nam Cheol Kim (1)
Jeong Su Kim (1)
Min Cheol Kim (1)
Hyeon Jae Kim (1)
Hyeon Ju Kim (1)
In Seong Kim (1)
Sang Su Kim (1)
Gwang Ho Kim (1)
Hun Kim (1)
Jae Gyeong Kim (1)
Sang Geol Kim (1)
Tae Wan Kim (1)
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Gi Ho Park (1)
Yong Jin Seo (1)
Dae Sig Seo (1)
Gyu Hwan Sim (1)
Hun Gyu Sin (1)
Yeong Ju Song (1)
Jae Seong Song (1)
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Previous issues
Volume 16(9); September 2003
Electrical and Structural Properties of Ti Thin Films on Al2O3 Substrate
Un Jo Jeong, Hyeon Hun Yang, Jeong Myeong Im, Yeong Jun Kim, Gye Chun Park
J Korean Inst Electr Electron Mater Eng
2003;16(9):753-758.
Published online September 1, 2003
DOI:
https://doi.org/10.4313/JKEM.2003.16.9.753
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57
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0
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Characteristics of 2-Step CMP (Chemical Mechanical Polishing) Process using Reused Slurry by Adding of Silica Abrasives
Yong Jin Seo, Gyeong Jin Lee, Un Sig Choe, Sang Yong Kim, Jin Seong Park, U Seon Lee
J Korean Inst Electr Electron Mater Eng
2003;16(9):759-764.
Published online September 1, 2003
DOI:
https://doi.org/10.4313/JKEM.2003.16.9.759
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54
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0
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High Quality Ultrathin Gate Oxides Grown by Low-Temperature Radical Induced Oxidation for High Performance SiGe Heterostructure CMOS Applications
Yeong Ju Song, Sang Hun Kim, Nae Eung Lee, Jin Yeong Kang, Gyu Hwan Sim
J Korean Inst Electr Electron Mater Eng
2003;16(9):765-770.
Published online September 1, 2003
DOI:
https://doi.org/10.4313/JKEM.2003.16.9.765
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54
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0
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Programming Characteristics of the Multi-bit Devices Based on SONOS Structure
Ju Yeon Kim
J Korean Inst Electr Electron Mater Eng
2003;16(9):771-774.
Published online September 1, 2003
DOI:
https://doi.org/10.4313/JKEM.2003.16.9.771
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52
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Electrical Conductivities of [(CeO2)1-x(ZrO2)x]0.8(SmO1.5)0.2 Solid Solution
Chung Yeon Lee, Yeong Sig Kim, Nam Cheol Kim
J Korean Inst Electr Electron Mater Eng
2003;16(9):775-782.
Published online September 1, 2003
DOI:
https://doi.org/10.4313/JKEM.2003.16.9.775
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50
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Properties of Electrical Performance on Stator Coil of Traction Motor by Accelerated Test using Transient Surge
Hyeon Jun Park, Dong Ug Jang, Gil Heon Lee, Jong Seon Choe, Jeong Su Kim
J Korean Inst Electr Electron Mater Eng
2003;16(9):783-789.
Published online September 1, 2003
DOI:
https://doi.org/10.4313/JKEM.2003.16.9.783
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59
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0
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Fabrication of Ceramic Thin Film Type Pressure Sensors for High-Temperature Applications and Their Characteristics
Gwi Sang Jeong
J Korean Inst Electr Electron Mater Eng
2003;16(9):790-794.
Published online September 1, 2003
DOI:
https://doi.org/10.4313/JKEM.2003.16.9.790
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49
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Dielectric and Piezoelectric Properties of xPb(Al0.5Nb0.5)O3-(1-x)Pb(Zr0.52Ti0.48)O3 Thin Films Prepared by PLD
Min Cheol Kim, Yong Ug Park, Ji Won Choe, Jong Yun Kang, Byeong Gug An, Hyeon Jae Kim, Seog Jin Yun
J Korean Inst Electr Electron Mater Eng
2003;16(9):795-800.
Published online September 1, 2003
DOI:
https://doi.org/10.4313/JKEM.2003.16.9.795
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A Study of Nanoscale Structure of Anodic Porous Alumina Film
Gyeong Han Jeong, Hun Gyu Sin, Yeong Su Kwon
J Korean Inst Electr Electron Mater Eng
2003;16(9):801-806.
Published online September 1, 2003
DOI:
https://doi.org/10.4313/JKEM.2003.16.9.801
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40
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The Characteristics of Ti-O Buffer Layered Ta/Ta2O5/Ta Capacitors on the Al2O3 Substrate
Hyeon Ju Kim, Jae Seong Song, In Seong Kim, Sang Su Kim
J Korean Inst Electr Electron Mater Eng
2003;16(9):807-811.
Published online September 1, 2003
DOI:
https://doi.org/10.4313/JKEM.2003.16.9.807
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63
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Study on the MgO Passivated PM-OLED using the Tilt & Rotate Technique
Gwang Ho Kim, Hun Kim, Jae Gyeong Kim, I Mi Do, Jeong In Han, Byeong Gwon Ju
J Korean Inst Electr Electron Mater Eng
2003;16(9):812-815.
Published online September 1, 2003
DOI:
https://doi.org/10.4313/JKEM.2003.16.9.812
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61
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Effects of Hole-Injection Buffer Layer in Organic Light-Emitting Diodes
Dong Hoe Jeong, Sang Geol Kim, Hyeon Seog O, Jin Ung Hong, Jun Ung Lee, Yeong Sig Kim, Tae Wan Kim
J Korean Inst Electr Electron Mater Eng
2003;16(9):816-825.
Published online September 1, 2003
DOI:
https://doi.org/10.4313/JKEM.2003.16.9.816
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53
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EO Characteristic in the Advanced Vertical Alignment (VA)-πCell a Homeotropic Blended Polymer
Jeong Yeon Hwang, Gyeong Jun Lee, Yong Min Jo, Dae Sig Seo
J Korean Inst Electr Electron Mater Eng
2003;16(9):826-832.
Published online September 1, 2003
DOI:
https://doi.org/10.4313/JKEM.2003.16.9.826
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66
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A Study on the Ultrashort Optical Pulse Generation of the Gain Switched V-Groove Quantum Wire Laser
Yeong Cheol Choe, Ju Yeon Kim, Tae Geun Kim
J Korean Inst Electr Electron Mater Eng
2003;16(9):833-837.
Published online September 1, 2003
DOI:
https://doi.org/10.4313/JKEM.2003.16.9.833
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51
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High Voltage Engineering : A Study on Partial Discharge Location in Insulating Oil using Optical Fiber Sensors
Tae Ho Kwon, Jong Gil Lee, Jun Ho Lee
J Korean Inst Electr Electron Mater Eng
2003;16(9):838-841.
Published online September 1, 2003
DOI:
https://doi.org/10.4313/JKEM.2003.16.9.838
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55
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High Voltage Engineering : Study on Performance and Aging Test of Porcelain Insulators for Transmission Line
Se Won Han, Han Gu Jo, Gi Ho Park, Dong Il Lee, In Hyeog Choe
J Korean Inst Electr Electron Mater Eng
2003;16(9):842-850.
Published online September 1, 2003
DOI:
https://doi.org/10.4313/JKEM.2003.16.9.842
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Citations
Citations to this article as recorded by
Deterioration of Porcelain Insulators Utilized in Overhead Transmission Lines: A Review
Simpy Sanyal, Fawad Aslam, Taeyong Kim, Seongho Jeon, Youn-Jung Lee, Junsin Yi, In-Hyuk Choi, Ju-Am Son, Ja-Bin Koo
Transactions on Electrical and Electronic Materials.2020; 21(1): 16.
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