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Volume 8(5); September 1995

Characteristics and Microstructure of MCFC Electrode: Gwi Yeol Kim, Seung Wook Eom; J Electr Electron Mater 1995;8(5):544-549.

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Tree Aging Observation of XLPE by Image Processing: Lim Jang Seob, Kim Tae Seoung, Gu Hal Bon, Noboru Yoshimura; J Electr Electron Mater 1995;8(5):551-557.

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Dynamic Characteristics of TbFeCo Magneto - Optical Recording Media at 680nm Wavelength Region: Doowon Yoon, Cheong Yeon, Myong Ryeong Kim; J Electr Electron Mater 1995;8(5):558-563.

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A Study on the Arc Discharge Characteristics of Liquid Insulating Materials for Electrical Discharge Machine: Sang Hyun Kim, Hae Jong Kim, Dae Young Ma, Tae Min Shin; J Electr Electron Mater 1995;8(5):564-570.

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Fabrication of Dual Mode Ultrasonic Transducers with PZT Piezoelectric Ceramics: Yeon Bo Kim, Yongrae Roh, Hyo Duk Nam; J Electr Electron Mater 1995;8(5):572-579.

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The Dielectric Characteristics of BaTiO3 Thin Capacitor: Kyung Jin Hong, Tae Sung Kim, Jun Hak Kim, Shunichi Hishita; J Electr Electron Mater 1995;8(5):580-585.

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Dielectric loss of Silicone oils for Insulation due to the increase of viscosity: Yong Woo Lee, Kyong Sun Cho, Wang Kon Kim, Jin Woong Hong; J Electr Electron Mater 1995;8(5):587-593.

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Microwave Dielectric Properties According to the Additions of NiO to ( Zr0.65,Sn0.35 ) Ti1.04 Ceramics: Jung Rag Yoon, Jung Youl Kwon, Heun Yong Lee, Kyung Yong Kim; J Electr Electron Mater 1995;8(5):594-599.

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The Polarity Effect of Electronic Waves Interference in the Ultra Thin Oxide MOS Capacitor: Jeong Jin Kang; J Electr Electron Mater 1995;8(5):601-605.

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Preparation and Ferroelectric Properties of the Pb ( Zr0.52Ti0.48 )O3 Thin Film by Sol - Gel , Method .: Chung jang Ho, Park In Gil, Ryu Ki Won, Bae Seon Gi, Lee Young Hie; J Electr Electron Mater 1995;8(5):606-610.

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A Study on the Dielectric and Electrical Conduction Properties of ( Sr1-x . Cax ) TiO3 Grain Boundary layer Ceramics: Woon Shik Choi, Chung Hyeok Kim, Joon Ung Lee; J Electr Electron Mater 1995;8(5):611-618.

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Effects of lead metal and annealing methods on low resistance contact formation of polycrystalline CdTe thin film: Hyeon Soo Kim, Ju Hoon Lee, Geun Yong Yeom; J Electr Electron Mater 1995;8(5):619-624.

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A Study on the Impedance Effect of Nonvolatile Memory Devices: Chang Soo Kang; J Electr Electron Mater 1995;8(5):626-632.

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Liquid Mist and Videotape Signal Dropouts in Gravure Roll Coating: Myong Ryeong Kim; J Electr Electron Mater 1995;8(5):633-639.

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A Study on Electrical Characteristics of Ceramics Capacitor for Temperature Compensation: Kyung Jin Hong, Woo Sung Jung, Tae Sung Kim, Yeun Hak Lee, Joon Ung Lee; J Electr Electron Mater 1995;8(5):640-646.

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Recent Trend of DRAM Technology: Byoung Gon Yu, Jong Tae Baek, Jong Son Lyu, Hyung Joun Yoo; J Electr Electron Mater 1995;8(5):648-657.

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The Characterization of Electronic Materials: In Shik Park; J Electr Electron Mater 1995;8(5):658-663.

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